ConsultIntermittent life burn-in test system(IOL3000)
This system is suitable for various packages (including F-type, TO-220, TO-247, TO-254, TO-257,TO-258, TO-3P, SMD-0.5, SMD-1, SMD-2, etc.) of high-power diodes, MOS transistor and otherpower devices for power cycling test and constant current power test. Each zone air duct of thesystem is independent, to fully avoid the impact of different test processes in different locationson the test results; During the experiment, machine can monitor the voltage and junctiontemperature characteristics of the component, and provide the junction temperature characteristiccurve for later data analysis.
Function
- Air cooling power cycle test
- Independent air duct in each location
- Strong wind cooling fan
- Maximum 60A current test capacity
- Support full open heating mode
- Full experimenter human safety considerations are set
Product Features
Experimental mode | Air cooling |
Test the air duct | 16 |
Burn-in test zone | 16 |
Stations per zone | 16~80 (typical) |
Maximum load | 300m (The cross-current mode of the device under test)60A (Saturation turn-on mode) |
Maximum voltage | 45V |
Maximum test temperature | 200°C |
Voltage detection accuracy | ± (1+2LSB) |
Grid control voltage | ±15V |
Junction temperaturetest current | Isense 10~100mA |
Ground resistance | ≤1Ω |
Machine power supply | Three-phase AC380V±38V |
Maximum power | 50KW (typical) |
Total weight | 700KG (typical) |
Dimensions of machine | 1800mm(W)x1400mm(D)x1950mm(H) |
Applicable standards
MIL-STD-750D AEC-Q101
Applicable components
For MOS transistors, diodes, triode, IGBT modules, PIM modules, SiC, GaN, SCR, etc.