ConsultCapacitor High-Temperature Burn-in Test System(MKP2040)
This system is capable of conducting capacitor burn-in and screening tests at temperatures ranging from room temperature +10°C to 200°C. During the burn-in process, it continuously monitors the leakage current and voltage status of the tested components, protects against out-of-spec devices, and records burn-in data as needed for generating test reports.
Function
- Leakage current detection accuracy in the nA range
- Entire system refreshes data for all workstations every 30 seconds
- Unique high-voltage suppression circuit prevents instant breakdown of components, safeguarding other burn-in processes
- Individual workstation burn-in exclusion
- Overcurrent protection with a response time of less than 100µs
- Specialized automatic charge and discharge circuit design
- Comprehensive consideration of personnel safety for experimenters
Product Features
Test Temperature Range | 1个 |
Test Temperature | Room Temperature +10°C to 200°C |
Burn-in Test Zones: | 16 zones (16/32/40 zones optional) |
Single Zone Workstations | 40(typical) |
Burn-in Voltage Range | 0~1200V |
Voltage Detection Accuracy | ±(1%+2LSB) |
Current Detection Range | 10nA~30mA |
Current Detection Accuracy | ±(1%+10nA) |
Power Supply | Three-phaseAC380V±38V |
Maximum Power | 8KW (typical) |
Total Weight | 680KG (typical) |
Overall Dimensions | 1400mm(W)×1400mm(D)×2000mm(H) |
Applicable standards
GJB360 MIL-STD-202E
Applicable components
Suitable for chip ceramic capacitors (MLCC), mica, films, paper, ceramic and metallized paper dielectric capacitors, etc.