MFS2020
Multi functional comprehensive burn-in test system
The system is applicable to burn-in of various medium and small power diodes, triodes,
medium and small power FETs, voltage-regulator tube, various resistors, opto-coupler,
3-end voltage regulators, and F, B, TO-92, TO-126, TO-247, TO-220, TO-3P, chip and
other packaging burn-in components, and is applicable to conducting steady-state
screening tests for medium and small power components and intermittent life tests for
high-power components.
