GPIC2004
Opto-couplers burn-in test system
The system can conduct high-temperature constant current and power burn-in test for various
single optocoupler, double optocoupler and four optocoupler devices. The system is applicable
to the life screening test and secondary screening test of various devices in research institutes,
microcircuit device manufacturers, etc., and is applicable to the test requirements of small
batch and multiple varieties.
