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High Temperature High Humidity Reverse Bias Burn-in Test System(H3TRB2005)

This system is designed for high temperature and high humidity (Double 85) burn-in tests. During the burn-in process, it monitors the leakage current and voltage status of the tested devices in real-time. It also records burn-in test data and generates test reports as needed.

Function

  • Leakage current detection accuracy in the nA range
  • Complete station data refresh every 30 seconds
  • Unique high-voltage suppression circuit prevents device breakdown from affecting other burn-in processes
  • Customizable independent voltage control for each station, allowing removal of out-of-specification stations
  • Comprehensive consideration for operator safety

Product Features

Test Temperature Zones

1

Test Temperature

Room temperature +10°C to 150°C

Test Humidity

10%rh to 98%rh

Burn-in Test Zones

16 zones (8/16 zones optional)

Single Zone Workstation Count

80 (typical)

Burn-in Voltage Range

0 to ±2000V

Voltage Detection Accuracy

±(1%+2LSB)

Current Detection Range

10nA to 50mA

Current Detection Accuracy

±(1%+10nA)

Power Supply

Three-phase AC380V±38V

Maximum Power

10KW (typical)

Total Weight

1000KG (typical)

Dimensions

1650mm (W) × 1750mm (D) × 1950mm (H)


Applicable standards

GJB128 MIL-STD-750D AEC-Q101 JESD22-A101

Applicable components

Suitable for MOSFETs, diodes, transistors, IGBT modules, PIM modules, thyristors, and more.