High Temperature High Humidity Reverse Bias Burn-in Test System(H3TRB2005)
This system is designed for high temperature and high humidity (Double 85) burn-in tests. During the burn-in process, it monitors the leakage current and voltage status of the tested devices in real-time. It also records burn-in test data and generates test reports as needed.
Function
- Leakage current detection accuracy in the nA range
- Complete station data refresh every 30 seconds
- Unique high-voltage suppression circuit prevents device breakdown from affecting other burn-in processes
- Customizable independent voltage control for each station, allowing removal of out-of-specification stations
- Comprehensive consideration for operator safety
Product Features
Test Temperature Zones | 1 |
Test Temperature | Room temperature +10°C to 150°C |
Test Humidity | 10%rh to 98%rh |
Burn-in Test Zones | 16 zones (8/16 zones optional) |
Single Zone Workstation Count | 80 (typical) |
Burn-in Voltage Range | 0 to ±2000V |
Voltage Detection Accuracy | ±(1%+2LSB) |
Current Detection Range | 10nA to 50mA |
Current Detection Accuracy | ±(1%+10nA) |
Power Supply | Three-phase AC380V±38V |
Maximum Power | 10KW (typical) |
Total Weight | 1000KG (typical) |
Dimensions | 1650mm (W) × 1750mm (D) × 1950mm (H) |
Applicable standards
GJB128 MIL-STD-750D AEC-Q101 JESD22-A101
Applicable components
Suitable for MOSFETs, diodes, transistors, IGBT modules, PIM modules, thyristors, and more.