ConsultHigh temperature burn-in test system for capacitors(IOL2000)
This system is suitable for various packages (including F-type, TO-220, TO-247, TO-254, TO-257, TO-258, TO-3P, SMD-0.5, SMD-1, SMD-2, etc.) of high-power diodes, MOS and other power devices for power cycling test and constant current power test. Each zone air duct of the system is independent, to fully avoid the impact of different test processes in different locations on the test results; During the experiment, machine can monitor the voltage and junction temperature characteristics of the component, and provide the junction temperature characteristic curve for later data analysis.
Function
- Air cooling power cycle test
- Independent air duct in each location
- Strong wind cooling fan
- Maximum 60A current test capacity
- Support full open heating mode
Product Features
Test temperature zone | 1(K-factor) |
Test temperature | RT+10~200℃(K-factor) |
Test zone | 16(8/16/20 zone optional) |
Stations per zone | 4(typical) |
Maximum work stations in series | 8 |
Burn-in voltage | 0~60V |
Voltage detection accuracy | ±(1%+2LSB) |
Current detection | 100mA~60A |
Current detection accuracy | ±(1%+100mA) |
Junction temperature test current(Isense) | 10~100mA |
Machine power supply | Three-phase AC380±38V |
Maximum power | 30KW (typical) |
Total weight | 1200KG (typical) |
Dimensions of machine | 2075mm(W)×1350mm(D)×1950mm(H) |
Applicable standards
GJB128 MIL-STD-750D AEC-Q101
Applicable components
For MOS FET, diode, triode and other power components