IGBT power cycle test system(PC1800A)
The system is suitable for power cycling test of various sizes of IGBT modules and uses the advanced JEDEC static test method (JESD51-1) to generate temperature changes by varying the input power of the electronic component. During the change, through transient temperature response curve of the tested chip and data processing of the test waveform to obtain the full thermal characteristics of the electronic component.
Function
- Supports minute/second power cycling test
- Equipped with oil-cooled platform, which can and automatically calibrate the K-factor of the component quickly
- Fixture supports adjustable strength and depth for effective clamping of different packaging of modules
- With solenoid water valve, can automatically adjust the cooling water flow according to the actual situation, or manually adjust
- Through the transient temperature response curve of the test component, data processing of the test waveform to obtain
- the comprehensive thermal characteristics of the electronic component
Product Features
Test temperature zone | 2 |
Test temperature | Water cooling plate:10~80 ℃, |
Test zone | 3 |
Constant temperature system | water cooling system:±0.5℃ |
Junction temperature test accuracy | ±2℃ |
Cold plate and shell temperature | ±2℃ |
Heating current | 600A/zone (supporting three zones in parallel 1800A) |
Test current | 10~1000mA |
Test current accuracy and resolution | ±(0.3%+2mA), resolution 0.5mA |
Machine power supply | Three-phase AC380±38V |
Maximum power | 30KW(typical) |
Total weight | 500KG (typical) |
Dimension of machine | 1400mm(W)×900mm(D)×1300mm(H) |
Applicable standards
GJB128 JESD51 AQG324
Applicable components
For various sizes of IGBT modules and Mos modules