Constant current burn-in test system for zener diode(MFS2003A)
The system is suitable for constant current power test of various packaging zener diodes and other diodes (including F type, TO-220, TO-247, TO-254, TO-257, TO-258, TO-3P, SMD-0.5, SMD-1, SMD-2).
Function
- Provide 12-way high-precision constant current electronic loads, which can control and protect each test component separately
- The burn-in power supply of the equipment can be set to program control mode and manual mode
- The transverse forced air cooling structure is adopted to take away the heat generated in the burn-in process, so that the temperature of the test chamber tends to be uniform
- 8 sets of independent fan cooling control components are provided to independently control 2 test zones
Product Features
Test temperature zone | 1 |
Test temperature | RT+10~200℃ (operating temperature 5~35℃ without oven) |
Test zone | 16 |
Testcurrent | 0~60A |
Testvoltage | 0~25V |
Currentdetection | 50mA~5A |
Voltagedetection | 0~25V |
Current detection accuracy | ±(1%+5mA) |
Voltagedetection accuracy | ±(1%+0.1V) |
Constant current electronic | 50mA~5A |
Precision of constant current | ±(1%+5mA) |
Burn-in mode | constant current, intermittent |
Power supply | 0~25V/60A (Optional 16 channels) |
Machine power supply | Three-phaseAC380±38V |
Maximum power | 15KW(typical) |
Total weight | 700KG (typical) |
Dimensions of machine | 1450mm(W)×1450mm(D)×2000mm(H) |
Applicable standards
GJB128 GJB33 MIL-STD-750
Applicable components
For voltage-regulator tube diodes and diodes of F type, TO-220, TO-247, TO-254, TO-257, TO-258, TO-3P, SMD-0.5,SMD-1, SMD-2 and other packaging zener diodes