High temperature burn-in test system for power module(MPS2000)
The system provides high temperature environment and test conditions (including input power supply, load, output voltage, load current, etc.) for the test requirements of power module, and also detects various test conditions, including input voltage, test chamber temperature, component output voltage, output current, and other main parameters. The system can adapt to the life screening test and secondary screening test of various components in research institutes, microcircuit component manufacturers, etc., and is applicable to the test requirements of small batch and multiple varieties.
Function
- Real time monitor electric stress, temperature stress and other information of the tested component, and automatic recording of process information
- The high-speed acquisition system adopts high-speed and high-precision ADC sampling
Product Features
Test temperature zone | 1 |
Test temperature | RT+10~200℃ |
Test zone | 16(16/24/32 zone optional) |
Burn-in board interface | High current pin hole connectoror finger connector |
Electronic loads | Single zone12/16channel, whole machine192~512 |
Optional primary power supply | 40V/60V/100V/300V/600V |
Linear dissipative 10V plus load | 0.8~10VDC, 300mA~30A, 32W, constant current accuracy±(1﹪+50mA), can be connected in parallel |
Linear dissipative 30V minus load | 0.8~30VDC, 50mA~6.25A, 32W, constant current |
Linear dissipative 100V plus | ±3.3~±100VDC, ±(50mA~5A), 32W, Constant current |
Shell temperature control range | 60~125℃, ±(1﹪+1℃) |
Machine power supply | Three-phase AC380V±38V |
Maximum power | 12KW(typical) |
Total weight | 680KG(typical) |
Dimensions of machine(mm) | 1400mm(W)×1400mm(D)×2000mm(H)(16zone) |
Applicable standards
GJB548 MIL-STD-883D MIL-M-28787 AEC-Q100 JESD22A-108 GB2423
Applicable components
For DC/DC power module, LDO integrated circuit, BUCK integrated circuit, DRMOS integrated circuit