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High-Temperature Reverse Bias
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HTXB2000

High temperature bias burn-in test system
The system can perform high-temperature reverse bias and gate bias burn-in testing at room temperature+10℃~+200℃, and monitor the leakage current state and voltage state of the tested device in real-time during the burn-in process. Current state, voltage state of the tested device, and record burn-in test data as needed, and export test reports.

HTRB3100

High temperature anti bias burn-in system
The system can perform high-temperature reverse bias burn-in testing at room temperature +10℃~+200℃, and monitor the leakage of the tested device in real-time during the burn-in process Current state, voltage state of the tested device, and record burn-in test data as needed, and export test reports.

HTRB4000

High temperature reverse bias burn-in test system
The system can carry out high-temperature reverse bias burn-in test at room temperature +10°C~+200°C, and monitor the leakage current state and voltage state of the device under test in real time during the burn-in process, and record the burn-in test data as needed, and export the test report.

HTRB2000

High temperature reverse bias burn-in test system
The system can perform the high temperature reverse bias burn-in test at room temperature +10℃~+200℃. During the burn-in process, it can monitor the leakage current state and voltage state of the tested component in real time, record and export the burn-in test data as required.

HTRB2003

HTRB burn-in test system
The system can perform the high temperature reverse bias burn-in test at room temperature +10 ℃~200 ℃. During the burn-in process, it can monitor the leakage current status and voltage status of the tested component in real time, (record and export the burn-in test data as required).

HTRB2020

HTRB burn-in test system
The system can perform the high temperature reverse bias burn-in test at room temperature +10 ℃~200 ℃. During the burn-in process, it can monitor the leakage current status and voltage status of the tested component in real time, (record and export the burn-in test data as required).

HTRB2040

HTRB burn-in test system
The system can perform the high temperature reverse bias burn-in test at room temperature +10 ℃~200 ℃. During the burn-in process, it can monitor the leakage current status and voltage status of the tested component in real time, (record and export the burn-in test data as required).