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Dynamic burn-in test system
Dynamic burn-in test system
Dynamic high temperaturegate bias burn-in test system
Dynamic high temperature reverse bias burn-in test system
Dynamic high temperature high humidity reverse bias burn-in test system
Integrated Circuit Experiment Equipment
Integrated Circuit (General)
Very large scale integration circuits burn-in test system
Large Scale Integrated Circuit Burn-in Test System
Integrated circuits dynamic high temperature burn-in test system
Integrated circuits dynamic high temperature burn-in test system
Integrated circuits dynamic high temperature burn-in test system
Integrated Circuit (Specialized) - Under Development
Intergrated circuit (specific type)
Intergrated circuit (specific type)
Power Cycling Equipment
Power Cycling Testing
IGBT power cycle test system
IGBT power cycle test system
Power Cycling Experiment
Power cycle test system
IGBT power module test system
IGBT power module test system
IGBT power module test system
High-Temperature Capacitor Testing Equipment
Capacitor Burn-in
High temperature high humidity burn-in test system for capacitors
High-Temperature Capacitor Burn-in Test System
Capacitor High-Temperature Burn-in Test System
High temperature burn-in test system for capacitors
Capacitance Testing
High temperature high resistance test system
High-Temperature Bias Test Equipment
High-Temperature Reverse Bias
High temperature anti bias burn-in system
High temperature reverse bias burn-in test system
HTRB burn-in test system
HTRB burn-in test system
HTRB burn-in test system
HTRB burn-in test system
High-Temperature Gate Bias
High temperature gate-bias burn-in test system
High temperature gate-bias burn-in test system
High temperature gate-bias burn-in test system
High temperature gate-bias burn-in test system
High Temperature High Humidity Reverse Bias
High Temperature High Humidity Reverse Bias Burn-in Test System
High Temperature and High Humidity Reverse Bias Burn-in Test System
High temperature high humidity reverse bias burn-in test system
Accelerated Life Testing - Under Development
Accelerated Life Testing - Under Development
Discrete Device Experiment Equipment
Power Devices
Dynamic power components burn-in test system
Comprehensive Burn-in (Multifunctional)
Multi functional comprehensive burn-in test system
Intermittent Life Testing
High temperature burn-in test system for capacitors
Intermittent life burn-in test system
Water cooling intermittent burn-intest system
Power cycle test system
Power cycle test system
Diode Burn-in
Constant current burn-in test system for zener diode
Zener diode constant current burn-in test system
High temperature high power burn-in test system for LED
Optocoupler Burn-in
Opto-couplers burn-in test system
High-Power Transistors
High-power transistors burn-in test system
Power Module Three-Terminal Regulator
Power Module (Small-Medium Power)
High temperature burn-in test system for power module
Power Module High-Temperature Burn-in Test System
Power Module (Small-Medium Power)
Power Module (High Power)
Power Module (High Power)
High temperature burn-in test system for high power module
Microwave Device Burn-in Test
Microwave Power Device DC Burn-in
High temperature static burn-in test system for microwave tubes
High temperature static burn-in test system for microwave tubes
Microwave power device direct current burn-in
Microwave Component RF Burn-in-Under Development
Microwave module radio frequency burn-in
Microwave Power Device RF Burn-in
Microwave power device radio frequency burn-in
Production Line Automation
Chamber type: Automatic door chamber, Auto-Device Load And Unload Burn-in Board
Equipment ALD Series
Hot Plate Type: IGBT Power Module
Equipment TCU Series
Burn-in Sockets·Test Sockets·Connectors
Power Supplies
High-Reliability Programmable Test Power Supply
DC Power Supply (1U/2U)
DC Power Supply
DC Power Supply
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再创佳绩!杭可仪器入选第五批国家级专精特新“小巨人”名单
为深入贯彻习近平总书记关于“培育一批‘专精特新’中小企业”的重要指示精神,工业和信息化部开展了第五批专精特新“小巨人”企业培育和第二批专精特新“小巨人”企业复核工作,现已完成相关审核。
2023/08/01
展会回顾|杭可仪器精彩亮相上海慕尼黑电子展
杭可仪器荣幸参加了上海慕尼黑电子展,展期从7月11日至13日,这是一场备受瞩目的电子行业盛会。作为可靠性测试行业的领军企业,杭可仪器展示了最新的老化测试设备和解决方案,吸引了众多专业人士和企业代表的关注。杭可仪器的展位C636成为展会现场的焦点之一。展览期间,我们与参会者进行了深入的技术交流和商务洽谈,共同探讨行业发展的前沿趋势和创新应用。
2023/07/14
【重要荣誉】浙江杭可仪器有限公司获得“首台套”证书!
在科技创新的道路上,浙江杭可仪器有限公司再次获得崭新的荣誉!近日,我们荣获2022年度浙江省首台套装备认定并获颁证书,这是对我们技术实力和创新能力的高度认可,也是对我们辛勤努力的美好回报。
2023/07/25
【邀请函】杭可仪器与您心芯相印,共聚慕尼黑上海电子展 !
慕尼黑上海电子展将于2023年7月11-13日在国家会展中心(上海)举办,本届展会面积规模计划扩大至10万平米,参展企业将达到1600+,预计吸引观众7万人次。
2023/07/06
杭可仪器参观SEMICON Southeast Asia 2023马来西亚半导体展会
浙江杭可仪器有限公司有幸参与了于2023年5月在马来西亚槟城举办的SEMICON Southeast Asia半导体展览会。作为一家致力于提供先进测试设备和解决方案的公司,我们为参与这一展会并与行业领先企业和专业人士交流深感荣幸。
2023/05/29
5月22日集成电路产业创新大会暨全国集成电路学院院长论坛圆满结束
杭可仪器荣幸成为2023中国(杭州)集成电路产业创新大会暨全国集成电路学院院长论坛的赞助商!我们在大会会场外设置了精美展台,向与会嘉宾展示了我们最新研发的老化设备。
2023/05/23
第二届第三代半导体材料技术与市场研讨会展会完美收官,带您回顾精彩瞬间!
为了促进第三代半导体材料领域的相互交流与合作,半导体在线于2023年3月30-31日在苏州合景万怡酒店组织召开2023年第二届第三代半导体材料技术与市场研讨会
2023/04/03
表彰先进,聚力前行!杭可仪器隆重召开2022年度优秀表彰大会
春华秋实又一载,砥砺奋进续新篇。2022年是公司转型发展任务十分繁重的一年。面对前所未有的复杂环境、内外困境以及风险挑战,在公司领导层的坚强领导下,在全体员工的共同努力奋斗下,公司上下勠力同心
2023/02/06
高光时刻 | 一起盘点杭可仪器2022年度大事记
岁序更迭,华章更新,2022年已悄然远去,回首这段不平凡的时光,在复杂的市场环境下,杭可仪器迎难而上、主动作为,攻坚克难、创新求变,全力以赴稳增长、促转型、谋发展
2023/01/16
2022慕尼黑华南电子展圆满落幕,杭可仪器期待与您再相遇
2022年11月15日-17日,慕尼黑华南电子展在深圳国际会展中心(宝安新馆)顺利开展。展会立足粤港澳大湾区,辐射华南、西南及东南亚市场,汇聚国内外知名企业以及大批专业人士前来参观,杭可仪器也在此次展会中隆重亮相。
2022/11/18
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