Consult

High temperature burn-in test system for capacitors(IOL2000)

This system is suitable for various packages (including F-type, TO-220, TO-247, TO-254, TO-257, TO-258, TO-3P, SMD-0.5, SMD-1, SMD-2, etc.) of high-power diodes, MOS and other power devices for power cycling test and constant current power test. Each zone air duct of the system is independent, to fully avoid the impact of different test processes in different locations on the test results; During the experiment, machine can monitor the voltage and junction temperature characteristics of the component, and provide the junction temperature characteristic curve for later data analysis.

Function

Air cooling power cycle test
Independent air duct in each location
Strong wind cooling fan
Maximum 60A current test capacity
Support full open heating mode

Product Features

Test temperature zone	1(K-factor)
Test temperature	RT+10~200℃(K-factor)
Test zone	16(8/16/20 zone optional)
Stations per zone	4(typical)
Maximum work stations in series	8
Burn-in voltage	0~60V
Voltage detection accuracy	±(1%+2LSB)
Current detection	100mA~60A
Current detection accuracy	±(1%+100mA)
Junction temperature test current(Isense)	10~100mA
Machine power supply	Three-phase AC380±38V
Maximum power	30KW (typical)
Total weight	1200KG (typical)
Dimensions of machine	2075mm(W)×1350mm(D)×1950mm(H)

Applicable standards

GJB128 MIL-STD-750D AEC-Q101

Applicable components

For MOS FET, diode, triode and other power components