Consult

High temperature high resistance test system(HTIR2010)

The system adopts an automatic measurement system, which can measure the IR value of capacitors at room temperature+10 ℃~150 ℃. During measurement, Through the module Group control of the displacement of the test probe for testing to ensure that only one capacitor is connected each time. Mechanical contact replaces relay switching to improve measurement accuracy.

Function

Real time monitor IR value of tested component
Keithley 6517B electrometer/megger is selected for measurement
Special burn-in test board can be customized according to different component packaging
When loading capacitors with impedance greater than 10 Ω, the
measured impedance shall not be less than 10 Ω

Product Features

Test temperature zone	1
Test Temperature	RT+10~150℃
Test zone	16
Stations per zone	48 (typical)
Measuring instrument	Keithley 6517B electrometer/megger
Test voltage	0~1000V
Insulation resistance	1MQ~1TQ
Machine power supply	One-phase AC220V±22V
Maximum power	5KW(typical)
Total weight	600KG(typical)
Dimensions of machine	1400mm(W)×1400mm(D)×2000mm(H)

Applicable standards

GJB360 MIL-STD-202E

Applicable components

For chip packaging: 04/06/08/10/12/18/20/22/28/32 and other sevies