Consult

High temperature reverse bias burn-in test system(HTRB4000)

The system can carry out high-temperature reverse bias burn-in test at room temperature+10°C~200°C, and monitor the leakage current state and voltage state of the device undertest in real time during the burn-in process, and record the burn-in test data as needed,and export the test report.

Function

The device is heated using a thermal platform heating method
Each device can realize an independent heating platform and independent temperature control
Good heat transfer characteristics, aiming at the high temperature and high leakage current characteristics of IGB Tmodules/discrete devices, it can achieve stable HTRB test at 175Tj
The independent protection function can be customized to realize the single-station overrun cut-off
The automatic loading platform, program gating, can be fully automated with the ground rail
The test cabinet can be added or reduced according to the demand
Full experimenter human safety considerations are set

Product Features

Test thermal platform	96
Test temperature	RT +10℃~200℃
Burn-in test zone	12
Voltage detection range	-2000V~+2000V
Voltage detection accuracy	±(1%+2LSB)
Current detection range	10nA~50mA
Current detection accuracy	±(1%+10nA)
Machine power supply	Three-phase AC380V±38V
Maximum power	32KW (typical)
Total weight	6000KG (typical)
Dimensions of machine (6+1 disposition)	7000mm(W) x 1200mm(D) x 2250mm(H)

Applicable standards

MIL-STD-750D AQG324

Applicable components

For MOS transistors, diodes, triode, IGBT modules, PIM modules, SCR, etc.