Integrated circuits dynamic high temperature burn-in test system(GPIC2020)

The system adopts TDBI technology and can perform HTOL burn-in test at room temperature +10°C~200°C. The current and output signal of the component are monitored in real time during the burn-in process.

Function

Real-time monitoring of the current and output signal of the component
With gold finger connector
Customized burn-in test board according to different component packaging, power and other requirements

Product Features

Test temperature zone	1
Test temperature	RT+10℃~200℃
Test zone	16
Digital signal frequency	12.5MHz(optional 20MHz)
Digital signal programming depth	16M
Digital signal programming step	40nS~0.5S
Digital signal channels	128 channel bi-directional (64 channels optional)
Digital signal mode	Support signal cycle, stepjumping and other modes
Maximum driving current of digital signal	Ioh≥150mA, Iol≥150mA
Analog signal output channel	4
Maximum driving current of analog signal	1A
Analog signal frequency	1Hz~5MHz
Analog signal synchronization phase	≤1°
Analog signal type	Arbitrary waveforms such as sine, triangle, leading-edge sawtooth, trailing-edge sawtooth, and adjustable pulse width square waveforms
Secondary power supply	4 channels 0.5~20V/15A
Current detection	0~15A
Voltage detection	0~20V
Machine power supply	Three-phase AC380V±38V
Maximum power	10KW(typical)
Total weight	750KG (typical)
Dimensions of machine	1400mm(W)×1400mm(D)×2000mm(H)

Applicable standards

Meets industry standards for high-reliability testing

Applicable components

For various analog circuits, digital circuits, digital-analog hybrid, opto-couplers, MCU, FPGA and other general-purpose integrated circuits