This system is suitable for various packages (including F-type, TO-220, TO-247, TO-254, TO-257, TO-258, TO-3P, SMD-0.5, SMD-1, SMD-2, etc.) of high-power diodes, MOS and other power devices for power cycling test and constant current power test. Each zone air duct of the system is independent, to fully avoid the impact of different test processes in different locations on the test results; During the experiment, machine can monitor the voltage and junction temperature characteristics of the component, and provide the junction temperature characteristic curve for later data analysis.

This system is suitable for various packages (including F-type, TO-220, TO-247, TO-254, TO-257,TO-258, TO-3P, SMD-0.5, SMD-1, SMD-2, etc.) of high-power diodes, MOS transistor and otherpower devices for power cycling test and constant current power test. Each zone air duct of thesystem is independent, to fully avoid the impact of different test processes in different locationson the test results; During the experiment, machine can monitor the voltage and junctiontemperature characteristics of the component, and provide the junction temperature characteristiccurve for later data analysis.

This system is suitable for various packages (including F-type, TO-220, TO-247, TO-254O-257,TO-258,TO-3P, SMD-0.5, SMD-1, SMD-2, etc,) of high-power diodes, Mosand other power devices for power cycling test and constant current power test, Thesystem is equipped with 12 water cooling plate to fully avoid the influence of different testprocesses on the test results in different zones, During the experiment, thevoltage and junctiontemperature characteristics of the device are monitored, and the junction temperature characteristiccurves are provided for later data analysis.

The system can carry out power cycle burn-in test for various power components, simulate the degradation of components under different power conditions, and carry out thermal fatigue test on the packaging, channel or internal bonding wire through the control of heating and cooling process.