This system is suitable for various packages (including F-type, TO-220, TO-247, TO-254, TO-257, TO-258, TO-3P, SMD-0.5, SMD-1, SMD-2, etc.) of high-power diodes,MOS transistor and other power devices for power cycling test and constant current power test. Each zone air duct of the system is independent, to fully avoid the impact of different test processes in different locations on the test results; During the experiment, machine can monitor the voltage and junction temperature characteristics of the component, and provide the junction temperature characteristic curve for later data analysis.