Consult

Intermittent life burn-in test system(IOL3000)

This system is suitable for various packages (including F-type, TO-220, TO-247, TO-254, TO-257, TO-258, TO-3P, SMD-0.5, SMD-1, SMD-2, etc.) of high-power diodes,MOS transistor and other power devices for power cycling test and constant current power test. Each zone air duct of the system is independent, to fully avoid the impact of different test processes in different locations on the test results; During the experiment, machine can monitor the voltage and junction temperature characteristics of the component, and provide the junction temperature characteristic curve for later data analysis.

Function

Air cooling power cycle test
Independent air duct in each location
Strong wind cooling fan
Maximum 60A current test capacity
Support full open heating mode
Full experimenter human safety considerations are set

Product Features

Experimental mode	Air cooling
Test the air duct	16
Burn-in test zone	16
Stations per zone	16~80 (typical)
Maximum load	300m (The cross-current mode of the device under test)60A (Saturation turn-on mode)
Maximum voltage	45V
Maximum test temperature	200°C
Voltage detection accuracy	± (1+2LSB)
Grid control voltage	±15V
Junction temperaturetest current	Isense 10~100mA
Ground resistance	≤1Ω
Machine power supply	Three-phase AC380V±38V
Maximum power	50KW (typical)
Total weight	700Kg (typical)
Dimensions of machine	1800mm(W)x1400mm(D)x1950mm(H)

Applicable standards

MIL-STD-750D AEC-Q101

Applicable components

For MOS transistor, diode, triode, IGBT module, PIM module, SiC, GaN, SCR, etc.