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Dynamic burn-in test system
Dynamic burn-in test system
Dynamic high temperaturegate bias burn-in test system
Dynamic high temperature reverse bias burn-in test system
Dynamic high temperature high humidity reverse bias burn-in test system
Integrated Circuit Experiment Equipment
Integrated Circuit (General)
Very large scale integration circuits burn-in test system
Large Scale Integrated Circuit Burn-in Test System
Integrated circuits dynamic high temperature burn-in test system
Integrated circuits dynamic high temperature burn-in test system
Integrated circuits dynamic high temperature burn-in test system
Integrated Circuit (Specialized) - Under Development
Intergrated circuit (specific type)
Intergrated circuit (specific type)
Power Cycling Equipment
Power Cycling Testing
IGBT power cycle test system
IGBT power cycle test system
Power Cycling Experiment
Power cycle test system
IGBT power module test system
IGBT power module test system
IGBT power module test system
High-Temperature Capacitor Testing Equipment
Capacitor Burn-in
High temperature high humidity burn-in test system for capacitors
High-Temperature Capacitor Burn-in Test System
Capacitor High-Temperature Burn-in Test System
High temperature burn-in test system for capacitors
Capacitance Testing
High temperature high resistance test system
High-Temperature Bias Test Equipment
High-Temperature Reverse Bias
High temperature anti bias burn-in system
High temperature reverse bias burn-in test system
HTRB burn-in test system
HTRB burn-in test system
HTRB burn-in test system
HTRB burn-in test system
High-Temperature Gate Bias
High temperature gate-bias burn-in test system
High temperature gate-bias burn-in test system
High temperature gate-bias burn-in test system
High temperature gate-bias burn-in test system
High Temperature High Humidity Reverse Bias
High Temperature High Humidity Reverse Bias Burn-in Test System
High Temperature and High Humidity Reverse Bias Burn-in Test System
High temperature high humidity reverse bias burn-in test system
Accelerated Life Testing - Under Development
Accelerated Life Testing - Under Development
Discrete Device Experiment Equipment
Power Devices
Dynamic power components burn-in test system
Comprehensive Burn-in (Multifunctional)
Multi functional comprehensive burn-in test system
Intermittent Life Testing
High temperature burn-in test system for capacitors
Intermittent life burn-in test system
Water cooling intermittent burn-intest system
Power cycle test system
Power cycle test system
Diode Burn-in
Constant current burn-in test system for zener diode
Zener diode constant current burn-in test system
High temperature high power burn-in test system for LED
Optocoupler Burn-in
Opto-couplers burn-in test system
High-Power Transistors
High-power transistors burn-in test system
Power Module Three-Terminal Regulator
Power Module (Small-Medium Power)
High temperature burn-in test system for power module
Power Module High-Temperature Burn-in Test System
Power Module (Small-Medium Power)
Power Module (High Power)
Power Module (High Power)
High temperature burn-in test system for high power module
Microwave Device Burn-in Test
Microwave Power Device DC Burn-in
High temperature static burn-in test system for microwave tubes
High temperature static burn-in test system for microwave tubes
Microwave power device direct current burn-in
Microwave Component RF Burn-in-Under Development
Microwave module radio frequency burn-in
Microwave Power Device RF Burn-in
Microwave power device radio frequency burn-in
Production Line Automation
Chamber type: Automatic door chamber, Auto-Device Load And Unload Burn-in Board
Equipment ALD Series
Hot Plate Type: IGBT Power Module
Equipment TCU Series
Burn-in Sockets·Test Sockets·Connectors
Power Supplies
High-Reliability Programmable Test Power Supply
DC Power Supply (1U/2U)
DC Power Supply
DC Power Supply
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2022/07/26
新品解读 | 杭可仪器老化座3大产业优势
功率器件及第三代半导体是当前的半导体产业技术追逐的热点,也是国内半导体产业中最有希望能够赶超世界先进技术的领域之一。现在众多国产功率半导体厂商已经在材料、设计、制造、封测等各个环节成功突围,逐渐形成自主可控的完整产业链。
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2021/12/13
从原理到应用,深刻解读杭可仪器全新一代老化测试机台
本文详细阐述了老化试验(筛选)的原理和目的,并以FPGA和DSP大规模集成电路芯片为例说明了其高温动态老化的一般方法。针对半导体芯片高温动态老化(Dynamic Burn-in)及老化中测试(Test-During-Burn-In)的更高需求,文章详细介绍了新一代国产老化测试机台LSIC2000的技术指标和先进特点。
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2020/12/30
超大规模集成电路老化测试系统的研究应用
随着智能时代的到来,超大规模集成电路在高端设备制造、5G、消费类电子产品的应用日趋广泛。与此同时,由超大规模集成电路产品瑕疵所引发的问题事故也层出不穷,在不同领域造成了严重的经济损失和商业影响。
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2020/11/18
智造先锋——智能老化集中监控系统
未来已来。智能化浪潮,不可阻挡地推动着人类社会快速发展,全方位影响着从生活到生产的方方面面,概无遗漏。从消费类电子产品到复杂的工业级应用,从智慧城市的基础改善到迈向寰宇的未知探索,半导体产业不断发展壮大,既催生于斯,又反哺于此,成为智能化程度最高的现代工业领域之一。
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