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Capacitor High-Temperature Burn-in Test System(MKP2040)

This system is capable of conducting capacitor burn-in and screening tests at temperatures ranging from room temperature +10°C to 200°C. During the burn-in process, it continuously monitors the leakage current and voltage status of the tested components, protects against out-of-spec devices, and records burn-in data as needed for generating test reports.

Function

Leakage current detection accuracy in the nA range
Entire system refreshes data for all workstations every 30 seconds
Unique high-voltage suppression circuit prevents instant breakdown of components, safeguarding other burn-in processes
Individual workstation burn-in exclusion
Overcurrent protection with a response time of less than 100µs
Specialized automatic charge and discharge circuit design
Comprehensive consideration of personnel safety for experimenters

Product Features

Test Temperature Range	1个
Test Temperature	Room Temperature +10°C to 200°C
Burn-in Test Zones:	16 zones (16/32/40 zones optional)
Burn-in Test Zones:	16 zones (16/32/40 zones optional)
Single Zone Workstations	40(typical)
Single Zone Workstations	40(typical)
Burn-in Voltage Range	0~1200V
Voltage Detection Accuracy	±(1%+2LSB)
Current Detection Range	10nA~30mA
Current Detection Accuracy	±(1%+10nA)
Power Supply	Three-phaseAC380V±38V
Maximum Power	8KW (typical)
Total Weight	680KG (typical)
Overall Dimensions	1400mm(W)×1400mm(D)×2000mm(H)

Applicable standards

GJB360 MIL-STD-202E

Applicable components

Suitable for chip ceramic capacitors (MLCC), mica, films, paper, ceramic and metallized paper dielectric capacitors, etc.