Home
About HangKe
About HangKe
Founder Profile
Company Profile
Development Timeline
Qualifications and Honor
Corporate Culture
Products
Products
Automotive-Grade
Static Reliability Test System
Dynamic Reliability Test System
Power Reliability Module Test System
Power Cycling Test System
Capacitor Reliability Test System
Solid-State Transformer (SST)
Static Reliability Test System
Dynamic Reliability Test System
Power Cycling Test System
Capacitor Reliability Test System
AI Data Center
Static Reliability Test System
Dynamic Reliability Test System
Power Cycling Test System
Capacitor Reliability Test System
Integrated Circuit Reliability Test System
Photovoltaic & Energy Storage
Static Reliability Test System
Dynamic Reliability Test System
Power Cycling Test System
Capacitor Reliability Test System
Wafer-Level Reliability Test System
Wafer-Level Reliability Test System
Automated Production Line Solutions
Automated Production Line Solutions
Automatic Loading & Unloading Equipment
Burn-in Sockets·Test Sockets·Connectors
Burn-in Sockets
DFN
DFN-5X6-S
DFN-8X8
DFN-8X8-S
DFN-5X6-Z
DFN-8X8-Z
DFN-5X6
TQFP
TQFP-64-0.5-01
TQFP-44-0.8-01
TQFP-44-0.8-02
TQFP-48-0.5-01
TQFP-48-0.5-02
TQFP-48-0.5-03
TQFP-64-0.8-01
TQFP-100-0.5-01
ITO
ITO-4P
TO
TO-3P
TO-252
TO-263-3L
TO-263-6L
TO-247-3LA
TO-3P-02
TO-4P
TO-4P(B4)
TO-5P-01
TO-6-02
CLCC
CLCC44-1.27-01
SOT
SOT-89-6L
SOT-2361
DIP
DIP-14-2.54
DIP-16-2.54
DIP-18-2.54
DIP-20-2.54
SOD
SOD-123
SOD-323
TOLL
TOLL-10X10
MCT
MCT-3600V-M
MCT-3600V-S
Connectors
COS
COS-50-3.175-B1-01
COS-50-2.54-B1-01
COS-22-3.96-01
COS-22-3.175
COS-50-3.96
COS-50-3.175-01
COS3-2.54
Test Sockets
BGA
BGA-1144-1.0-01
PGA
PGA-685-1.27-01
Power Supplies
High-Reliability Programmable Test Power Supply
DC Power Supply (1U/2U)
Programmable Dc power supply
Programmable Dc power supply
Environment Test Chamber
News
News
Company News
Employee Zone
Technical Columns
Service Support
Service Support
Download Area
Testing Services
Contact Us
Contact Us
Sales Consultation
Talent Recruitment
CN
Home
About HangKe
Founder Profile
Company Profile
Development Timeline
Qualifications and Honors
Corporate Culture
Products
Automotive-Grade
Solid-State Transformer (SST)
AI Data Center
Photovoltaic & Energy Storage
Wafer-Level Reliability Test System
Automated Production Line Solutions
Burn-in Sockets·Test Sockets·Connectors
Power Supplies
Environment Test Chamber
News
Company News
Employee Zone
Technical Columns
Service Support
Download Area
Testing Services
Contact Us
Sales Consultation
Talent Recruitment
CN
EN
News
Master the world development trend, walking in the leading edge.
Current Location:
Home
News
All News
Company News
Employee Zone
Technical Columns
Hangke Headlines
Full Moon in Golden Autumn, Warmth Touches Hearts | Hangke Instrument Sends Yearnings with Gifts, Greets the National Day with Craftsmanship
2026/09/24
Successful Conclusion | Our Company Shines at 2026 IICIE International Integrated Circuit Innovation Expo
2026/09/15
Exhibition Review|Hangke Instrument’ Successful Conclusion of Shenzhen Trip See You at IICIE in September
2026/09/02
With over 40‑year dedication to reliability testing, Hangke Instrument invites you to PCIM Asia 2026 in Shenzhen.
2026/08/18
Company News
More >
Full Moon in Golden Autumn, Warmth Touches Hearts | Hangke Instrument Sends Yearnings with Gifts, Greets the National Day with Craftsmanship
2026/09/24
Successful Conclusion | Our Company Shines at 2026 IICIE International Integrated Circuit Innovation Expo
2026/09/15
Exhibition Review|Hangke Instrument’ Successful Conclusion of Shenzhen Trip See You at IICIE in September
2026/09/02
Technical Columns
More >
新品解读 | 杭可仪器老化座3大产业优势
从原理到应用,深刻解读杭可仪器全新一代老化测试机台
超大规模集成电路老化测试系统的研究应用
智造先锋——智能老化集中监控系统
Employee Zone
More >
幸福不止一“夏”
一岁一礼,一寸欢喜。6月14日下午,公司精心准备了一场温馨的员工生日会,让寿星们在百忙之中收获一份轻松,尽情享受专属的幸福时光。
2022/06/15
“叮~生日快乐”——杭可仪器5月员工生日会
2022/05/19
暖心相聚 共赴成长
2022/01/20