Cao Ji

Cao Ji

Born in 1952, is the Chairman and Founder of Zhejiang Hangke Instrument Co., Ltd., and a pioneer in the field of integrated circuit reliability testing in China.

In 1971, after graduation, he was assigned to Hangzhou Semiconductor Factory. Starting from the basic position of electronic engineer, he devoted himself to the relatively niche field of reliability testing engineering. For more than 40 years, he has been deeply engaged in semiconductor and electronic component reliability testing technologies. He has personally participated in major scientific research projects such as national defense “Seven Special Projects,” the “Long March” rockets, and the “Shenzhou Series” manned spaceflight programs. He has witnessed and promoted the entire development process of China’s semiconductor reliability testing industry from its beginning, from weakness to strength.

In 1984, he founded Hangzhou Reliability Instrument Factory, the predecessor of Hangke Instrument, with self-raised funds. The company focused on the research and development of aging screening and reliability testing equipment for electronic components, becoming one of the earliest pioneers in China to enter the field of semiconductor reliability testing equipment development. In the early stage of entrepreneurship, he personally led his team to work deeply in the laboratory, overcoming technical challenges in extreme environment testing, including high and low temperature, damp heat, and aging tests. The team accumulated a large amount of reliability testing data and core technologies, laying the technical foundation for the development of domestic semiconductor reliability testing equipment. Under his leadership, the team won multiple provincial and municipal science and technology progress awards.

Pioneer in China’s Semiconductor Reliability Testing Field · Founder of Hangke Instruments

Industry Giant | Reliability Testing Trailblazer | A Benchmark Built Through Four Decades of Dedication

For more than 40 years, Cao Ji has remained true to his original aspiration. Together with Hangke Instrument, he has always focused on the core technologies of semiconductor reliability testing. In particular, the company has achieved innovative breakthroughs in high-precision electrical performance measurement technology, digital power supply control technology, automated logistics conveying technology, and integrated control software testing and analysis technology, breaking foreign technological monopolies. These technologies have been widely applied in various independently developed industrial equipment for semiconductor device testing and screening, as well as industrial equipment for post-processing lithium battery formation and capacity grading.

Today, Hangke Instrument has successfully developed a full industrial chain of reliability testing equipment covering wafer-level, chip-level, and module-level applications. As a pioneer and leader in China’s semiconductor reliability testing field, Cao Ji upholds the philosophy of “reliability as the foundation and technological innovation as the soul.” Through craftsmanship and perseverance, he has established Hangke Instrument as a benchmark in the field of semiconductor reliability testing, helping China achieve independent and controllable reliability testing capabilities for the semiconductor industry, and building a solid reliability foundation for the high-quality development of China’s integrated circuit industry.