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Static Reliability Test System
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HTRB2000

High temperature reverse bias reliability test system
The system can perform the high temperature reverse bias reliability test at room temperature +10°C~+200°C. During the burn-in process, it can monitor the leakage current state and voltage state of the tested component in real time, record and export the burn-in test data as required.

HTRB3100

High temperature reverse bias reliability test system
The system can perform high-temperature reverse bias reliability testing at room temperature+10℃~+230℃, and monitor the leakage of the tested device in real-time during the burn-in process Current state, voltage state of the tested device, and record burn-in test data as needed, and export test reports.

HTXB4100

High temperature bias reliability test system
The system can perform high temperature reverse bias and gate bias reliability testing at room temperature+10℃~+200℃, and monitor the leakage current state and voltage state of the tested device in real-time during the burn-in process. Current state, voltage state of the tested device, and record burn-in test data as needed, and export test reports.

HTGB2000

High temperature gate bias reliability test system
The system can perform high temperature gate bias reliability tests at room temperature +10 °C~+200 °C. During the burn-in process, the leakage current state and voltage state of the tested device are monitored in real-time, and burn-in test data is recorded as needed, and test reports are exported.

H3TRB2000

High temperature high humidity reverse bias reliability test system
The system can perform high temperature and high humidity (double 85) reliability test. During the burn-in process, it can monitor the leakage current state and voltage state of the tested component in real time, record and export the burn-in test data as required.