Product Navigation
Integrated Circuit Reliability Test System
You're here： Home Products AI Data Center Integrated Circuit Reliability Test System

LSIC7000

Large scale integrated circuit burn-in test system
The system supports dual temperature zones, and can carry out HTOL burn-in test at room tempera-ture ~+150°C, and detect the output signal of the device in real time during the burn-inprocess, in which the vectors are automatically compared.

LSIC9000

Large Scale Integrated Circuit Burn-in Test System
The system can perform HTOL test on the chip at RT ~+150°C. The output signal of the component is monitored in real time and the vector is automatically compared during the burn-in process.