High temperature high humidity reverse bias reliability test system(H3TRB2000)

The system can perform high temperature and high humidity (double 85) reliability test. During the burn-in process, it can monitor the leakage current state and voltage state of the tested component in real time, record and export the burn-in test data as required.

Function

nA level leakage current detection accuracy
30s full station data refresh of the machine
Unique high-voltage suppression circuit, instantaneous breakdown of components, without affecting burn-in process of other stations
Customizable independent control function of burn-in voltage of work station to realize single work station burn-in over limit rejection
Customizable positive and negative power supplies to achieve simultaneous application of bias voltage to the upper and lower bridges of the module
Full experimenter human safety considerations are set

Product Features

Test temperature zone	1
Test temperature	RT +20℃～+150℃
Test humidity	25%rh～98%rh
Burn-in test zone	16 (8/16 zone optional)
Stations per zone	80 (typical)
Voltage range	module: -2000V~2000V (Customizable up to ±20000V)) Discrete Device: 0V~2000V (Customizable up to 20000V)
Voltage detection accuracy	±(1%+2LSB)
Current detection range	10nA~50mA
Current detection accuracy	±(1%+10nA)
Machine power supply	Three-phase AC380V±38V
Maximum power	10KW (typical)
Total weight	1000Kg (typical)
Dimensions of machine	1650mm(W)×1750mm(D)×1950mm(H)

Applicable standards

AQG 324、AEC Q101

Applicable components

For SiC MOS transistor, diode, triode, IGBT module, PIM module, SCR, etc.