High-Pressure Accelerated Stress Test System(HAST2000)

This system is capable of high-temperature, high-humidity and high-pressure accelerated burn-in testing. During burn-in process, it conducts real-time monitoring of leakage current and voltage of devices under test. Burn-in test data can be logged as required and test reports exported.

Function

nA level leakage current detection accuracy
30s full station data refresh of the machine
Unique high-voltage suppression circuit, instantaneous breakdown of components, without affecting burn-in process of other stations
Customized independent control function of burn-in voltage of the work station to eliminate the burn-in overrun of a single station
Full experimenter human safety considerations are set

Product Features

Test temperature zone	1 / 2 (determined by the oven unit)
Test temperature	105℃ up to a maximum of 150℃
Test humidity	65%-100% RH
Pressure range	0.019-0.208 MPa
Test channels	4 channels (single-chamber); 8 channels (dual-chamber)
Measuring stations for single chamber	20 stations (expandable up to 160 stations subject to the maximum capacity of oven test sockets)
Voltage range	0V-1000V
Voltage measurement accuracy	±(1% + 2LSB), resolution: 0.1V
Current measuring range	0.1μA-50mA
Current measurement accuracy	±(1% + 2LSB)
Machine power supply	AC220V±22V
Maximum power	12kW
Total weight	700kg
Dimensions of machine	Control cabinet: 1840mm (H) × 1000mm (W) × 1000mm (D) Test chamber (typical): 1840mm (H) × 800mm (W) × 1000mm (D)

Applicable standards

AQG324

Applicable components

Diodes, triode, MOSFET, Darlington transistors, thyristors, SiC devices, IGBT modules, PIM modules.