High temperature bias reliability test system for capacitors(MKP2000)

The system can perform reliability test for capacitors at room temperature +10°C~+200°C, monitor the leakage current state and voltage state of the measured components in real time during the burn-in process, protect and reject the over-limit components, record and export the burn-in test data as required.

Function

Leakage current detection accuracy of nA level
30s full station data refresh of the whole machine
Unique high-voltage suppression circuit, instantaneous breakdown of components, without affecting burn-in process of other stations
Single station burn-in rejection
Over current protection response time is less than 10ms
Unique design of automatic charging and discharging circuit
Full experimenter human safety considerations are set

Product Features

Test temperature zone	1
Test temperature	RT +10~+200°C
Test zone	16 (16/32/40 zone optional)
Stations per zone	40 (typical)
Voltage range	0~1200V
Voltage detection accuracy	±(1%+2LSB)
Current detection range	10nA~30mA
Current detection accuracy	±(1%+10nA)
Machine power supply	Three-phase AC380V±38V
Maximum power	8KW (typical)
Total weight	680Kg (typical)
Dimensions of machine	1400mm(W)×1400mm(D)×2000mm(H)

Applicable standards

AEC Q200

Applicable components

For MLCC, mica, film, paper media, ceramic and metallized paper media capacitors etc.